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authorJérémy Dufour2008-03-01 18:13:13 +0100
committerJérémy Dufour2008-03-01 18:13:13 +0100
commit99e387e488e94ab78f50529fdc58b3fad7ec9cae (patch)
tree850ef4f6733f7726b5801323dfdad0d3d645f4f0 /digital/avr/modules/twi/test/Makefile.master
parentb00920a750534ae581107f4ea48a0d0c6ffba05e (diff)
* TWI: modify to have a working test on cards:
- work with one byte of data exchanged (master send a byte to slave then read it back); - does not manage when slave is not here (no timeout); - use more proto_ functions rather than uart_ ones; - support reset and unknown functions on both test programs; - update configurations to be compatible with the cards used for the test; - add comments.
Diffstat (limited to 'digital/avr/modules/twi/test/Makefile.master')
-rw-r--r--digital/avr/modules/twi/test/Makefile.master2
1 files changed, 1 insertions, 1 deletions
diff --git a/digital/avr/modules/twi/test/Makefile.master b/digital/avr/modules/twi/test/Makefile.master
index fa4f22ed..63d6baf8 100644
--- a/digital/avr/modules/twi/test/Makefile.master
+++ b/digital/avr/modules/twi/test/Makefile.master
@@ -11,7 +11,7 @@ TEST_CONFIGFILES = avrconfig_master.h
# atmega8, atmega8535, atmega128...
-AVR_MCU = atmega8535
+AVR_MCU = atmega128
# -O2 : speed
# -Os : size
OPTIMIZE = -O2